(Invited) Challenges on Surface Conditioning in 3D Device Architectures: Triple-Gate FinFETs, Gate-All-Around Lateral and Vertical Nanowire FETsA. Veloso, Nadine Collaert, Waikin Li et al.|ECS Transactions|2017Cited by 8
(Invited) Challenges on Surface Conditioning in 3D Device Architectures: Triple-Gate FinFETs, Gate-All-Around Lateral and Vertical Nanowire FETsA. Veloso, Nadine Collaert, Vasile Paraschiv et al.|ECS Meeting Abstracts|2017Cited by 0