Selective Area Growth of InP and Defect Elimination on Si (001) SubstratesGang Wang, Marc Heyns, Maarten Leys et al.|Journal of The Electrochemical Society|2011Cited by 22
Determination of the structure and orientation of nanometer-sized precipitates in matrix materials via transmission diffraction signals emitted by bulk samples in the Scanning Electron MicroscopeEtienne Brodu, Marc Seefeldt, Kim Vanmeensel et al.|Materials Characterization|2020Cited by 13