Wafer-to-wafer process fault detection using data stream mining techniquesJong Myoung Ko, Chang Ouk Kim, Seong Rok Hong et al.|International Journal of Precision Engineering and Manufacturing|2012Cited by 6
Process start/end event detection and dynamic time warping algorithms for run-by-run process fault detectionJa Young Choi, Seung‐Jun Lee, Jong Myoung Ko et al.|Unknown|2007Cited by 4
Process Start/End Event Detection and Dynamic Time Warping Algorithms for Run-by-Run Process Fault Detection ISSM Paper: PC-P-101Ja Young Choi, Seung Jun Lee, Jong Myoung Ko et al.|Unknown|2007Cited by 1
Robust Process Fault Detection System Under Asynchronous Time Series Data SituationJong Myoung Ko, Seung Jun Lee, Sang Joon Sun et al.|IE interfaces|2007Cited by 0