Profiling the Interface Electron Gas of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mi>LaAlO</mml:mi><mml:mn>3</mml:mn></mml:msub><mml:mo>/</mml:mo><mml:msub><mml:mi>SrTiO</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math>Heterostructures with Hard X-Ray Photoelectron SpectroscopyM. Sing, R. Claessen, Karin Goß et al.|Physical Review Letters|2009Cited by 288