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Peter E. Blöchl

University of Göttingen

ORCID: 0000-0002-1416-5207

Publishes on Advanced Chemical Physics Studies, Spectroscopy and Quantum Chemical Studies, Electronic and Structural Properties of Oxides. 139 papers and 105.2k citations.

139Publications
105.2kTotal Citations

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Top publicationsby citations

Projector augmented-wave method
Peter E. Blöchl|Physical review. B, Condensed matter|1994
Cited by 90k

An approach for electronic structure calculations is described that generalizes both the pseudopotential method and the linear augmented-plane-wave (LAPW) method in a natural way. The method allows high-quality first-principles molecular-dynamics calculations to be performed using the original fictitious Lagrangian approach of Car and Parrinello. Like the LAPW method it can be used to treat first-row and transition-metal elements with affordable effort and provides access to the full wave function. The augmentation procedure is generalized in that partial-wave expansions are not determined by the value and the derivative of the envelope function at some muffin-tin radius, but rather by the overlap with localized projector functions. The pseudopotential approach based on generalized separable pseudopotentials can be regained by a simple approximation.

Improved tetrahedron method for Brillouin-zone integrations
Peter E. Blöchl, O. Jepsen, O. K. Andersen|Physical review. B, Condensed matter|1994
Cited by 7.2k

Several improvements of the tetrahedron method for Brillouin-zone integrations are presented. (1) A translational grid of k points and tetrahedra is suggested that renders the results for insulators identical to those obtained with special-point methods with the same number of k points. (2) A simple correction formula goes beyond the linear approximation of matrix elements within the tetrahedra and also improves the results for metals significantly. For a required accuracy this reduces the number of k points by orders of magnitude. (3) Irreducible k points and tetrahedra are selected by a fully automated procedure, requiring as input only the space-group operations. (4) The integration is formulated as a weighted sum over irreducible k points with integration weights calculated using the tetrahedron method once for a given band structure. This allows an efficient use of the tetrahedron method also in plane-wave-based electronic-structure methods.

Implementation of the projector augmented-wave LDA+U method: Application to the electronic structure of NiO
O. Bengone, M. Alouani, Peter E. Blöchl et al.|Physical review. B, Condensed matter|2000
Cited by 570Open Access

The so-called local-density approximation (LDA) plus the multiorbital mean-field Hubbard model (LDA+U) has been implemented within the all-electron projector augmented-wave method, and then used to compute the insulating antiferromagnetic ground state of NiO and its optical properties. The electronic and optical properties have been investigated as a function of the Coulomb repulsion parameter U. We find that the value obtained from constrained LDA $(U=8$ eV) is not the best possible choice, whereas an intermediate value $(U=5$ eV) reproduces the experimental magnetic moment and optical properties satisfactorily. At intermediate U, the nature of the band gap is a mixture of charge transfer and Mott-Hubbard type, and becomes almost purely of the charge-transfer type at higher values of U. This is due to the enhancement of the oxygen $2p$ states near the top of the valence states with increasing U value.

First-principles calculations of defects in oxygen-deficient silica exposed to hydrogen
Peter E. Blöchl|Physical review. B, Condensed matter|2000
Cited by 402

Hydrogen-related defects and oxygen vacancies in silica are analyzed using first-principles density-functional calculations. Energetics, structures, charge-state levels, and hyperfine parameters are determined. These calculations identify the hydrogen bridge related to the ${E}_{4}^{\ensuremath{'}}$ center as the defect responsible for the stress-induced leakage current, a forerunner of dielectric breakdown of gate oxides in transistors.