A nonoptical tip–sample distance control method for near-field scanning optical microscopy using impedance changes in an electromechanical systemJulia W. P. Hsu, Bascom S. Deaver, Mark Lee|Review of Scientific Instruments|1995Cited by 97
An impedance based non-contact feedback control system for scanning probe microscopesMark Lee, Julia W. P. Hsu, E. B. McDaniel|Review of Scientific Instruments|1996Cited by 45
Terahertz near-field imagingJohn F. Federici, Ken West, Oleg Mitrofanov et al.|Physics in Medicine and Biology|2002Cited by 32