Topology optimization and lightweight design of stamping dies for forming automobile panelsTing Su, Maojun Li, Tao He et al.|The International Journal of Advanced Manufacturing Technology|2022Cited by 14
Dual-domain Attention-based Deep Network for Sparse-view CT Artifact\n ReductionXiang Gao, Yongshuai Ge, Ting Su et al.|arXiv (Cornell University)|2022Cited by 4
Dual-domain Attention-based Deep Network for Sparse-view CT Artifact ReductionYongshuai Ge, Ting Su, Yunxin Zhang et al.|arXiv (Cornell University)|2022Cited by 1