L

Lei R. Cao

Peking University

ORCID: 0000-0003-4018-9496

Publishes on Nuclear Physics and Applications, Radiation Detection and Scintillator Technologies, Perovskite Materials and Applications. 176 papers and 11.1k citations.

176Publications
11.1kTotal Citations

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Top publicationsby citations

Electron-hole diffusion lengths &gt; 175 μm in solution-grown CH <sub>3</sub> NH <sub>3</sub> PbI <sub>3</sub> single crystals
Qingfeng Dong, Yanjun Fang, Yuchuan Shao et al.|Science|2015
Cited by 5.5kOpen Access

Long, balanced electron and hole diffusion lengths greater than 100 nanometers in the polycrystalline organolead trihalide compound CH3NH3PbI3 are critical for highly efficient perovskite solar cells. We found that the diffusion lengths in CH3NH3PbI3 single crystals grown by a solution-growth method can exceed 175 micrometers under 1 sun (100 mW cm(-2)) illumination and exceed 3 millimeters under weak light for both electrons and holes. The internal quantum efficiencies approach 100% in 3-millimeter-thick single-crystal perovskite solar cells under weak light. These long diffusion lengths result from greater carrier mobility, longer lifetime, and much smaller trap densities in the single crystals than in polycrystalline thin films. The long carrier diffusion lengths enabled the use of CH3NH3PbI3 in radiation sensing and energy harvesting through the gammavoltaic effect, with an efficiency of 3.9% measured with an intense cesium-137 source.

Determination of X-ray detection limit and applications in perovskite X-ray detectors
Lei Pan, Shreetu Shrestha, Neil R. Taylor et al.|Nature Communications|2021
Cited by 172Open Access

X-ray detection limit and sensitivity are important figure of merits for perovskite X-ray detectors, but literatures lack a valid mathematic expression for determining the lower limit of detection for a perovskite X-ray detector. In this work, we present a thorough analysis and new method for X-ray detection limit determination based on a statistical model that correlates the dark current and the X-ray induced photocurrent with the detection limit. The detection limit can be calculated through the measurement of dark current and sensitivity with an easy-to-follow practice. Alternatively, the detection limit may also be obtained by the measurement of dark current and photocurrent when repeatedly lowering the X-ray dose rate. While the material quality is critical, we show that the device architecture and working mode also have a significant influence on the sensitivity and the detection limit. Our work establishes a fair comparison metrics for material and detector development.