A Geometric Approach to Modeling Microstructurally Small Fatigue Crack Formation. 2; Simulation and Prediction of Crack Nucleation in AA 7075-T651
Jake D. Hochhalter, Antionette M. Maniatty, Anthony R. Ingraffea(Cornell University), J. E. Bozek(Cornell University), David John Littlewood(Sandia National Laboratories California), Michael Veilleux(Sandia National Laboratories), Robert J. Christ(Northrop Grumman (United States))
Unknown
June 1, 2010
Cited by 2
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