Defect Sizing and Location by Lock-in Photo-Infrared Thermography
Man‐Yong Choi, Koung-Suk Kim, Won-Tae Kim(Korea University of Technology and Education), Jeong-Hak Park, Ki-Soo Kang
Journal of the Korean Society for Nondestructive Testing
January 1, 2007
Cited by 5
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