Embedded Percolated Metallic Networks With Ultrathin Conformal Coverage for Enhanced Silicon Hot‐Electron SWIR Photodetection and Single‐Pixel Imaging
Yupei Shen(Fudan University), C Zhang(Suzhou University of Science and Technology), Tong Yu(Suzhou University of Science and Technology), Xiaofeng Li(Fujian Business University), Ying Luo(Suzhou University of Science and Technology), Binglin Huang(Suzhou University of Science and Technology), Yanan Bao(State Key Laboratory on Integrated Optoelectronics), Jihao Li(Suzhou University of Science and Technology), Cheng Zhou(Northeast Normal University), Xinyu Peng(Suzhou University of Science and Technology)
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