Input-Data Dependence and Technology Trend of Soft Error Rate in Flip-Flops

IEEE International Symposium on Reliability Physics 2026, Taiki Uemura(Samsung (South Korea)), Byungjin Chung(Samsung (South Korea)), Jongho Lee(Seoul National University), Shinyoung Chung(Samsung (South Korea)), Minjung Jin(Samsung (South Korea))
Underline Science Inc.
March 7, 2026
Cited by 0


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