Input-Data Dependence and Technology Trend of Soft Error Rate in Flip-Flops
IEEE International Symposium on Reliability Physics 2026, Taiki Uemura(Samsung (South Korea)), Byungjin Chung(Samsung (South Korea)), Jongho Lee(Seoul National University), Shinyoung Chung(Samsung (South Korea)), Minjung Jin(Samsung (South Korea))
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