Parameterized inversion of electrical impedance tomography with sparse and dense case sampling
Jessie M. Sheflin(Northwestern University), M. Grayson(Northwestern University), Martin Bulst(IS Instruments (United Kingdom)), Claire C. Onsager(Northwestern University), Amadou Bah(Northwestern University), Alan V. Sahakian(Northwestern University), Sankalp K. Ganeshan(Northwestern University)
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