Data for Electron Microscopy Transfer System to Protect Atmosphere-sensitive Materials for Scanning Electron Microscopy Characterization
Louis G. Corcoran(University of Minnesota System), R Lee Penn(University of Minnesota System), Alon V. McCormick(University of Minnesota), Ellen M. Monzo(University of Minnesota System), Chris Fretham(University of Minnesota System), Bharat Jalan(University of California, Santa Barbara), Chinomso E. Onuoha(University of Minnesota System), Shivasheesh Varshney(University of Minnesota), H. LEE(University of Minnesota System)
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