Electron Microscopy Transfer System to Protect Atmosphere‐Sensitive Materials for Scanning Electron Microscopy Characterization
Louis G. Corcoran(University of Minnesota System), R. Lee Penn(University of Minnesota), Alon V. McCormick(University of Minnesota), Shivasheesh Varshney(University of Minnesota), Bharat Jalan(University of California, Santa Barbara), Chinomso E. Onuoha(University of Minnesota System), Ellen M. Monzo(University of Minnesota System), Han Seung Lee(University of Minnesota), Chris Frethem(University of Minnesota)
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