Physical Aspects of Electron Microscopy and Microbeam AnalysisTimothy K. Maugel, Benjamin M. Siegel, D. R. BeamanTransactions of the American Microscopical SocietyApril 1, 197610.2307/3225079Cited by 353SaveCiteExport RISWatch citationsAbstractRelated PapersNo related papers foundPowered by citation graph analysis