Observation of out-of-plane ferroelectricity in ∼5 nm ultrathin SrBi2Ta2O9 films for memristors and synapses application
Liping Tan(Hefei University of Technology), Wei Zhang(Nanjing University of Posts and Telecommunications), Xuefeng Hu(Hefei University of Technology), Aowen Li(Chinese Academy of Sciences), Yi Bi(Hefei University of Technology), Ming Zhou(Hefei University of Technology), Xiaoliang Wang(Hefei University of Technology), Zilong Wang(Max Planck Institute of Quantum Optics), Daquan Yu(Xiamen University of Technology), Qing-Qing Mu(Hefei University of Technology), Guopeng Zhang(Shenyang University of Technology)
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