Terahertz pulse time-domain reflection for accurate detection of wire voids in integrated circuits: A simulation and experimental validation

Zhen Xu(Tianjin University), Jianquan Yao(Tianjin University), Kai Chen(Tianjin University), Degang Xu(Tianjin University), Jining Li(Tianjin University), Longhai Liu(Tianjin University), Man Luo(Chinese Academy of Medical Sciences & Peking Union Medical College), Chao Yan(China Aerospace Science and Industry Corporation (China))
Microelectronics Reliability
November 5, 2025
Cited by 0


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