Scanning Tunneling Microscopy Characterization of Intrinsic Point Defects and Their Local Density of States in α-In <sub>2</sub> Se <sub>3</sub>
Wenhui Pang(University of Science and Technology of China), Shengyong Qin(Sun Yat-sen University), Jieying Li(University of Science and Technology of China), Wenguang Zhu(University of Science and Technology of China), Yuzhou Liu(North China Electric Power University), Desheng Cai(University of Science and Technology of China), Zi Liu(University of Science and Technology of China), Yu Gan(University of Science and Technology of China), Siyu Huo(University of Science and Technology of China)
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