Uncertainty Quantification of Silicon Anode Capacity Fading with Multiple Interactive Degradation Mechanisms Using Physics-Informed Gaussian Process Modeling

Parth Bansal(University of Illinois Urbana-Champaign), Pingfeng Wang(University of Illinois Urbana-Champaign), Paul V. Braun(University of Illinois Urbana-Champaign), Yumeng Li(Changchun University of Science and Technology), Peilin Lu(Sun Yat-sen University)
Journal of The Electrochemical Society
October 1, 2025
Cited by 0


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