Van der Waals Integration of 1D Nb <sub>2</sub> Pd <sub>3</sub> Se <sub>8</sub> and 2D WSe <sub>2</sub> for Gate‐Tunable In‐Sensor Image Processing

Vu Khac Dat(Sungkyunkwan University), Ji‐Hee Kim(Institute for Basic Science), Robert A. Taylor(University of Oxford), Văn Tú Vũ(Sungkyunkwan University), Jae‐Young Choi(Nano Carbon (Poland)), Chengyun Hong(Pohang University of Science and Technology), Byung Joo Jeong(Sungkyunkwan University), Minh Chien Nguyen(Sungkyunkwan University), Woo Jong Yu(Sungkyunkwan University), Jinsu Kang(Sungkyunkwan University), Xiaojie Zhang(Qingdao University of Science and Technology), Van Dam(Sungkyunkwan University), Kwangseuk Kyhm(Pusan National University), Duong Hai Phuong(Sungkyunkwan University), Ngoc Thanh Duong(Sungkyunkwan University)
Advanced Materials
August 13, 2025
Cited by 15


Related Papers