Multi-laboratory measurements of 12CH <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si75.svg" display="inline" id="d1e2397"> <mml:msub> <mml:mrow/> <mml:mrow> <mml:mn>4</mml:mn> </mml:mrow> </mml:msub> </mml:math> <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si53.svg" display="inline" id="d1e2405"> <mml:mrow> <mml:mn>2</mml:mn> <mml:msub> <mml:mrow> <mml:mi>ν</mml:mi> </mml:mrow> <mml:mrow> <mml:mn>3</mml:mn> </mml:mrow> </mml:msub> </mml:mrow> </mml:math> -band line parameters. Part I: Line intensities with relative combined standard uncertainties at the permille level
Zachary Reed(National Institute of Standards and Technology), Joseph T. Hodges(National Institute of Standards and Technology), Yan Tan(University of Science and Technology of China), David A. Long(National Institute of Standards and Technology), Christian Röske(Deutsches Zentrum für Luft- und Raumfahrt e. V. (DLR)), Manfred Birk, Georg Wagner(Deutsches Zentrum für Luft- und Raumfahrt e. V. (DLR)), Shui-Ming Hu(University of Science and Technology of China), Rui-Heng Yin(University of Science and Technology of China), Christina E. Cecelski(National Institute of Standards and Technology)
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