Characterizing sample degradation from synchrotron based X-ray measurements of ultra-thin exfoliated flakes
M. F. DiScala(Brown University), K. W. Plumb(Brown University), Bjarke S. Jessen(Columbia University), G. Natale(Austrian Academy of Sciences), Valerie Hsieh(Columbia University), Maëlle Kapfer(Columbia University), Jacob Amontree(University of Florida), Jonathan Pelliciari(Brookhaven National Laboratory), Valentina Bisogni(Brookhaven National Laboratory), Daniel J. Rizzo(Columbia University), D. N. Basov(Columbia University), Cory R. Dean(Columbia University), Xi Yan(Columbia University), Kenneth S. Burch(Boston College), T. K. Kim(Diamond Light Source), Qingsong Wang(Brown University), James Hone(Columbia University), Yanhong Gu(Brookhaven National Laboratory), Michael Geiwitz(Boston College)
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