Simultaneous measurement of charge carrier density, mobility, and their transients with four electrical contacts: Frequency-multiplexed Hall effect method
Can Aygen(Northwestern University), M. Grayson(Northwestern University), W. Wegscheider(ETH Zurich), James Williams(Northwestern University), Jiajun Luo(Northwestern University), D. Bruce Buchholz(Northwestern University), David R. Daughton(Lake Shore Cryotronics (United States)), Christopher Cravey(Northwestern University), Christian Reichl(ETH Zurich)
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