Tuning the charge trapping properties of organic field-effect transistor memories via a co-evaporated bulk heterojunction approach
Yonghao Yang(Army Medical University), Mingdong Yi(Nanjing University of Posts and Telecommunications), Ye Chen(Qingdao University), Wen Li(Nanjing University of Posts and Telecommunications), Hao Yu(China National GeneBank), Wei Huang(Innovation Team (China)), Wei Shi(University of Electronic Science and Technology of China)
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