Selecting variant masks to improve power and replicability of gene-level burden tests
Trang Thi Huyen Nguyen(Broad Institute), Jason Flannick(Broad Institute), Satoshi Yoshiji(McGill Genome Centre), Dongkeun Jang(Korea Electric Power Corporation (South Korea)), Annie Moriondo(Broad Institute), Quy Hoang(Broad Institute), Patrick Smadbeck(Broad Institute), Patrick T. Ellinor(Broad Institute), Sean J. Jurgens(Amsterdam University Medical Centers), Armando Llamas(Broad Institute), Peter Dornbos(Regeneron (United States)), Noël P. Burtt(Broad Institute), Oliver Ruebenacker(UConn Health), Ryan Koesterer(Broad Institute)
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