Impact of Environmental Conditions on the Remaining Useful Lifetime of SiC MOSFET
Md Zakir Hasan(Mississippi State University), Chun‐Hung Liu(Mississippi State University), Seungdeog Choi(University of Akron), Ashik Amin(Mississippi State University), Prashant Singh(University of Tennessee at Knoxville), Md. Moniruzzaman(Islamic University of Technology)
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