Effective Defect Detection Using Instance Segmentation for NDI
Ashiqur Rahman(Northern Illinois University), Hamed Alhoori(Northern Illinois University), Zachary Kral(Spirit AeroSystems (United States)), Venkata Devesh Reddy Seethi(Northern Illinois University), Rajkumar Kettimuthu(Argonne National Laboratory), Austin Yunker(Argonne National Laboratory)
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