On the longevity and inherent hermeticity of silicon-ICs: evaluation of bare-die and PDMS-coated ICs after accelerated aging and implantation studies
Kambiz Nanbakhsh(Delft University of Technology), Vasiliki Giagka(Fraunhofer Institute for Reliability and Microintegration), Timothy G. Constandinou(Imperial College London), Wouter A. Serdijn(BioElectronics (United States)), Anne Vanhoestenberghe(King's College London), Ömer Can Akgun(National Institute for Subatomic Physics), Domonkos Horváth(Pázmány Péter Catholic University), Csaba Dücső(HUN-REN Centre for Energy Research), Nick Donaldson(University College London), Domokos Meszéna(Pázmány Péter Catholic University), Ahmad Shah Idil(UK Dementia Research Institute), István Ulbert(Semmelweis University), Federico Mazza(Imperial College London), Kinga Tóth(Institute of Cognitive Neuroscience and Psychology), Callum Lamont(University College London)
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