Compositionally-graded ferroelectric thin films by solution epitaxy produce excellent dielectric stability
Ruian Zhang(Zhejiang University), Zhaohui Ren(Zhejiang University), Xiaohe Miao(Westlake University), Yu Song(Beijing Institute of Technology), Houbing Huang(Beijing Institute of Technology), Zhe Ren(Shanxi University), Haojie Han(Tsinghua University), Qiaoshi Zeng(Shanxi University), Yong Jun Wu(Zhejiang University), Jing Ma(First Affiliated Hospital of Henan University), Gaorong Han(Zhejiang University), Yueqi Wang(Hebei Normal University), Chen Lin(Zhejiang Lab), Zijun Zhang(Zhejiang University), Hongliang Dong(Center for High Pressure Science and Technology Advanced Research), He Tian(University of Antwerp), Yiran Sun(Zhejiang University)
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