Depth‐of‐Discharge Dependent Capacity Decay Induced by the Accumulation of Oxidized Lattice Oxygen in Li‐Rich Layered Oxide Cathode
Kang Zhang(Hunan University), Shi‐Gang Sun(Xiamen University), Qizheng Zheng(Xiamen University), Qirui Liu(Beijing University of Chemical Technology), Lirong Zheng(Chinese Academy of Sciences), Yongchen Wang(Third Affiliated Hospital of Zhengzhou University), Jianhua Yin(BGI Group (China)), Chong‐Heng Shen, Qingsong Wang(University of Bayreuth), Yuanlong Zhu(Xiamen University), Jing Zhang(Chinese Academy of Sciences), Baodan Zhang(Xiamen University), Na Liu(Institute of Contemporary History), Yu Qiao(Xiamen University), Huan Huang(Guangzhou University), Yilong Chen(Xiamen University), Jiao Wen(Institute of Contemporary History), Haiyan Luo(Collaborative Innovation Center of Chemistry for Energy Materials), Yawen Yan(Xiamen University), Yonglin Tang(Xiamen University), Dongyan Yu(Xiamen University), Linhui Zeng(Xiamen University)
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