Utilising unsupervised machine learning and IoT for cost-effective anomaly detection in multi-layer wire arc additive manufacturing
Giulio Mattera(University of Naples Federico II), Stephen van Duin(University of Wollongong), Luigi Nele(University of Naples Federico II), Joseph Polden(University of Wollongong), Evan Brown(University of Wollongong), Emily W. Yap(University of Wollongong)
The International Journal of Advanced Manufacturing Technology
October 24, 2024
Cited by 16
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