Experimental Study on the Damage Effect of HPM on LNA

Jiawei Huang(University of Electronic Science and Technology of China), Yong Luo(University of Electronic Science and Technology of China), Ruilong Song(University of Electronic Science and Technology of China), Chunguang Ma(Chinese Academy of Sciences), Bicheng Zhang(University of Electronic Science and Technology of China), Mingwen Zhang(University of Electronic Science and Technology of China)
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