RDB-YOLOv8n: Insulator defect detection based on improved lightweight YOLOv8n model

Yong Jiang(Chengdu University of Traditional Chinese Medicine), Lintao Zhou(Huaqiao University), Jun Shi(Zhengzhou University of Light Industry), Wanyong Liang(Zhengzhou University of Light Industry), Weifeng Cao(Zhengzhou University of Light Industry), Shuai Wang(Southwest University)
Journal of Real-Time Image Processing
September 28, 2024
Cited by 14


Related Papers