Nondestructive testing of chips faults based on Terahertz pulse time-domain reflection technology

Zhen Xu(Tianjin University), Degang Xu(Tianjin University), Xiang Ren(Dalian Medical University), Nan Zhang(China Aerospace Science and Industry Corporation (China)), Man Luo(Chinese Academy of Medical Sciences & Peking Union Medical College), Xiuming Qiao(China Aerospace Science and Industry Corporation (China)), Tan Wang(China Aerospace Science and Industry Corporation (China)), Longhai Liu(Tianjin University)
Physics Letters A
August 27, 2024
Cited by 5


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