Anomaly Classification and Key Segment Detection in Semiconductor Manufacturing Processes Using Image-Based Siamese Networks
Jung In Kim(Kyung Hee University), Seoung Bum Kim(The University of Texas at Arlington), Jae Hoon Kim, Hyeonji Kim(Hyosung Corporation (South Korea)), Jihoon Hong, Ju Yeon Yun, Hyodong Ban, Hyoheon Ko, Jeong Hun Ko, Chunghyup Mok, Yeonjung Kim, Jiyoul Lee(University of Minnesota)
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