Anomaly Classification and Key Segment Detection in Semiconductor Manufacturing Processes Using Image-Based Siamese Networks
Jung In Kim(Kyung Hee University), Seoung Bum Kim(Korea University), Jae Hoon Kim(Chungnam National University), Hyeonji Kim(Hyosung Corporation (South Korea)), Jihoon Hong, Ju Yeon Yun, Hyodong Ban, Hyoheon Ko, Jeong Hun Ko, Chunghyup Mok, Yeonjung Kim, Jiyoul Lee(University of Minnesota)
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