Bayesian-optimized LSTM-DWT approach for reliable fault detection in MMC-based HVDC systems
Muhammad Zain Yousaf(Hubei University of Automotive Technology), Євген Зайцев(National Academy of Sciences of Ukraine), Mohit Bajaj(Graphic Era University), Saqib Khalid(University of Lahore), Arvind R. Singh(Lingnan Normal University), B. Hemanth Kumar
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