Short failure localization in advanced package using optoelectronic sampling terahertz time domain reflectometry and deconvolution method

Longhai Liu(Tianjin University), Jianquan Yao(Tianjin University), Degang Xu(Tianjin University), Zhen Xu(Tianjin University), Yang Shang(Tongji University), Kangrong Li(Tianjin University), Yang Qiao(Beijing Microelectronics Technology Institute), Jining Li(Nanjing Normal University)
Microelectronics Journal
July 17, 2024
Cited by 6


Related Papers