Demystifying Edge Cases in Advanced IC Packaging Inspection through Novel Explainable AI Metrics
Shajib Ghosh(University of Florida), Navid Asadizanjani(University of Florida), Sanjeev J. Koppal(University of Florida), Md Mahfuz Al Hasan(University of Florida), Patrick Craig(University of Florida), Nitin Varshney(Marwadi University), Antika Roy(University of Florida)
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