Characterization of Threshold Voltage Shift in SiC MOSFETs Under Nanosecond-Range Switching and Its Impact on High- Frequency Applications
Junsong Jiang(Anhui University), Wenping Cao(Shanghai Jiao Tong University), Xi Tang(Anhui University), Kun Tan(Anhui University), Haoran Li, Hui Li(Southern Illinois University Carbondale), Mohan Tian(Harbin Medical University), Wenjie Zhu(Huazhong University of Science and Technology), Cungang Hu(Anhui University), Yichen Xu(Anhui University), Zhihao Hu(University of Science and Technology of China)
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