Concurrent delamination propagation and deformation localization in semiconductor devices

Shawn R. Lavoie(Harvard University), Zhigang Suo(Harvard University), Yu-Sheng Lin(Taiwan Semiconductor Manufacturing Company (Taiwan)), Guodong Nian(Harvard University), Chenwei Li(Ningbo University Affiliated Hospital), Jyun-Lin Wu(Taiwan Semiconductor Manufacturing Company (Taiwan)), Sherwin Tang(Taiwan Semiconductor Manufacturing Company (Taiwan)), Jason Lan(Taiwan Semiconductor Manufacturing Company (Taiwan)), Joost J. Vlassak(Harvard University)
Mechanics of Materials
May 4, 2024
Cited by 2


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