Sensitivity volume as figure-of-merit for maximizing data importance in electrical impedance tomography
Claire C. Onsager(Northwestern University), M. Grayson(Northwestern University), Charles Costakis(Northwestern University), Suzan van der Lee(Northwestern University), Chulin Wang(Northwestern University), Can Aygen(Northwestern University), Lauren Lang(Northwestern University)
Cited by 8
Related Papers
The heat equation shrinks embedded plane curves to round points
|Journal of Differential Geometry|1987|1k
GaS and GaSe Ultrathin Layer Transistors
|Advanced Materials|2012|677
Shortening Embedded Curves
|Annals of Mathematics|1989|365
Continuum of Chiral Luttinger Liquids at the Fractional Quantum Hall Edge
|Physical Review Letters|1998|234
Classification of wind streaks on Mars
|Icarus|1981|128