<i>In situ</i> edge extraction enabled by reconfigurable van der Waals infrared photodetectors
Jinjin Wang(Shanghai Institute of Technical Physics), Jinshui Miao(Shanghai Institute of Technical Physics), Siyu Long(Shanghai Institute of Technical Physics), Hangyu Xu(Shanghai Institute of Technical Physics), Qixiao Zhao(Shanghai Institute of Technical Physics), Xiao Fu(Dongguk University), Yu Jiang(Shanghai Institute of Technical Physics), Yihong She(Shanghai Institute of Technical Physics), Yueyue Fang(Shanghai Institute of Technical Physics), Xiaolong Chen(Southern University of Science and Technology), Yue Chen(Wenzhou Medical University), Fang Zhong(Shanghai Institute of Technical Physics), Tangxin Li(Shanghai Institute of Technical Physics), Xinyu Ma(Shanghai Institute of Technical Physics), Hong‐Yi Lin(University of Chinese Academy of Sciences)
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