Determination of Trace Organic Contaminant Concentration via Machine Classification of Surface-Enhanced Raman Spectra
Vishnu Jayaprakash(University of Alberta), Xuehua Zhang(Tianjin University of Science and Technology), Jae Bem You(Kyungpook National University), Christopher McCallum, Chiranjeevi Kanike(Indian Institute of Technology Kharagpur), Jinfeng Liu(University of Alberta)
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