Statistically unbiased prediction enables accurate denoising of voltage imaging data

Minho Eom(Korea Advanced Institute of Science and Technology), Seungjae Han(Korea Advanced Institute of Science and Technology), Pojeong Park(Harvard University), Gyuri Kim(Korea Advanced Institute of Science and Technology), Eun‐Seo Cho(Korea Advanced Institute of Science and Technology), Jueun Sim(Korea Advanced Institute of Science and Technology), Kang‐Han Lee(Chungnam National University), Seonghoon Kim(Seoul National University), He Tian(Harvard University), Urs L. Böhm(Harvard University), Eric Lowet(Boston University), Hua-an Tseng(Boston University), Jieun Choi(Korea Advanced Institute of Science and Technology), Stephani Edwina Lucia(Korea Advanced Institute of Science and Technology), Seung Hyun Ryu(Seoul National University), Márton Rózsa(Allen Institute), Sunghoe Chang(Seoul National University), Pilhan Kim(Korea Advanced Institute of Science and Technology), Xue Han(Boston University), Kiryl D. Piatkevich(Westlake University), Myunghwan Choi(Seoul National University), Cheol‐Hee Kim(Chungnam National University), Adam E. Cohen(Harvard University), Jae‐Byum Chang(Korea Advanced Institute of Science and Technology), Young‐Gyu Yoon(Korea Advanced Institute of Science and Technology)
Nature Methods
September 18, 2023
Cited by 68Open Access
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Abstract

Here we report SUPPORT (statistically unbiased prediction utilizing spatiotemporal information in imaging data), a self-supervised learning method for removing Poisson-Gaussian noise in voltage imaging data. SUPPORT is based on the insight that a pixel value in voltage imaging data is highly dependent on its spatiotemporal neighboring pixels, even when its temporally adjacent frames alone do not provide useful information for statistical prediction. Such dependency is captured and used by a convolutional neural network with a spatiotemporal blind spot to accurately denoise voltage imaging data in which the existence of the action potential in a time frame cannot be inferred by the information in other frames. Through simulations and experiments, we show that SUPPORT enables precise denoising of voltage imaging data and other types of microscopy image while preserving the underlying dynamics within the scene.


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