Deep Learning for Automated Quantification of Irradiation Defects in TEM Data: Relating Pixel-level Errors to Defect Properties
Rajat Sainju(University of Connecticut), Yuanyuan Zhu(Central South University), Wei‐Ying Chen(Argonne National Laboratory), Danny J. Edwards(Pacific Northwest National Laboratory), Qian Yang(University of Connecticut), Meimei Li(Argonne National Laboratory), Caiwen Ding(Syracuse University), Graham Roberts(Pacific Northwest National Laboratory), Brian Hutchinson(Joint Global Change Research Institute)
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