Residual stress measurement system of the general purpose powder diffractometer at CSNS

Jiazheng Hao(Chinese Academy of Sciences), Lunhua He(Karlsruhe Institute of Technology), Haibiao Zheng(Chinese Academy of Sciences), Dandan Zhao(Shanghai Institute of Microsystem and Information Technology), Zhijian Tan(Chinese Academy of Sciences), Jie Chen(Second People’s Hospital of Yibin), Qiangtao Ma(Chinese Academy of Sciences), Sihao Deng(Chinese Academy of Sciences), Feiran Shen(Chinese Academy of Sciences), Huaile Lu(Chinese Academy of Sciences)
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
July 12, 2023
Cited by 14


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