A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers
Moinul Shahidul Haque(Nexteer Automotive (United States)), Jeihoon Baek(Korea University of Technology and Education), Sangshin Kwak(Chung-Ang University), Seungdeog Choi(University of Akron), Ahmed H. Okilly(Korea University of Technology and Education), Md. Moniruzzaman(Islamic University of Technology)
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