Ab Initio Computational Screening and Performance Assessment of van der Waals and Semimetallic Contacts to Monolayer WSe<sub>2</sub>P-Type Field-Effect Transistors

Ning Yang(Chinese Academy of Medical Sciences & Peking Union Medical College), Han Wang(IBM Research - Thomas J. Watson Research Center), Szuya Sandy Liao(Taiwan Semiconductor Manufacturing Company (Taiwan)), Iuliana Radu(IMEC), Wei-Yen Woon(Taiwan Semiconductor Manufacturing Company (Taiwan)), Ang‐Sheng Chou(Taiwan Semiconductor Manufacturing Company (Taiwan)), H.‐S. Philip Wong(City University of Hong Kong), Jing Guo(University of Science and Technology of China), Chih‐Piao Chuu(Institute of Atomic and Molecular Sciences, Academia Sinica), Xiaofeng Qian(Lishui City People's Hospital), Yuxuan Lin(University of Alabama), Mohammad Saifur Rahman(Pennsylvania State University), Shengxi Huang(University of Liverpool), Hung‐Yu Chen(Taiwan Semiconductor Manufacturing Company (United States)), Tong Wu(University of Florida)
IEEE Transactions on Electron Devices
February 6, 2023
Cited by 26


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