Methods to Realize Low-BER and High-Reliability RRAM Chip With Fast Page-Forming Capability

Xueqi Li(Tsinghua University), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Bin Gao(Chinese Academy of Sciences), Jianshi Tang(Tsinghua University), Junyi Wang(Tsinghua University), He Qian(University of Science and Technology of China), Liyang Pan(Institute of Microelectronics)
IEEE Transactions on Electron Devices
January 2, 2023
Cited by 8


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